In X-ray microscopy technology,the penetrating ability of X-rays is utilized,combined with precision positioning and data inversion techniques,to reveal the internal structure,density and defects of the sample on micron even submicron scale.It has become an important physical analysis method and has been widely used in the fields of life science,materials science and advanced manufacturing.The microfocus X-ray source is one of the core components of the X-ray microscopy system,and its performance directly affects the systems test resolution and efficiency.Aiming at the requirements of safety protection,work efficiency improvement and control precision in the use of micro-focus X-ray source,according to the composition and working principle of microfocus X-ray system,a set of PLC-based micro-focus X-ray source control system was designed and its specific implementation process was introduced.JIMA resolution test card was used for resolution imaging experiments,the resolution of the 3 micron pair was achieved.It proves that the control system has good performance and can meet the needs of use.